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TXRF saturation effects in atomic contamination analysis for advanced micro-electronic devices
Publication:
TXRF saturation effects in atomic contamination analysis for advanced micro-electronic devices
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Date
2005-03
Dissertation
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10415.pdf
1.35 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hellin, David
Journal
Abstract
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1
since deposited on 2021-10-16
Acq. date: 2025-12-15
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1904
since deposited on 2021-10-16
Acq. date: 2025-12-15
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Downloads
1
since deposited on 2021-10-16
Acq. date: 2025-12-15
Views
1904
since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations