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Applying complementary trap characterization technique to crystalline g-phase-Al2O3 for improved understanding of nonvolatile memory operation and reliability
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Applying complementary trap characterization technique to crystalline g-phase-Al2O3 for improved understanding of nonvolatile memory operation and reliability
Date
2010
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zahid, Mohammed
;
Ruiz Aguado, Daniel
;
Degraeve, Robin
;
Wang, W.C
;
Govoreanu, Bogdan
;
Toledano Luque, Maria
;
Afanasiev, V.V.
;
Van Houdt, Jan
Journal
IEEE Transactions on Electron Devices
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1951
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
1951
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations