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Infrared studies of oxygen precipitation related defects in silicon after various thermal treatments
Publication:
Infrared studies of oxygen precipitation related defects in silicon after various thermal treatments
Date
1996
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vanhellemont, Jan
;
Kissinger, G.
;
Clauws, P.
;
Kaniava, Arvydas
;
Libezny, Milan
;
Gaubas, Eugenijus
;
Simoen, Eddy
;
Richter, H.
;
Claeys, Cor
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1923
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1923
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations