Experimental comparison between relaxed and strained Ge pFinFETs

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Author(s)

Oliveira, Alberto

;

Agopian, P.G.D.

;

Martino, Joao A.

;

;

;

Witters, Liesbeth

;

Collaert, Nadine

;

Metrics

1925 since deposited on 2021-10-24

Acq. date: 2025-10-28