Publication:

Experimental comparison between relaxed and strained Ge pFinFETs

Date

2017
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorOliveira, Alberto
dc.contributor.authorAgopian, P.G.D.
dc.contributor.authorMartino, Joao A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorMitard, Jerome
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorCollaert, Nadine
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-24T10:23:29Z
dc.date.available2021-10-24T10:23:29Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29107
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7962576/
dc.source.beginpage180
dc.source.conferenceJoint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - EUROSOI-ULIS
dc.source.conferencedate3/04/2017
dc.source.conferencelocationAthens Greece
dc.source.endpage183
dc.title

Experimental comparison between relaxed and strained Ge pFinFETs

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
35586.pdf
Size:
246.6 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions