Publication:

Multi-VT Options at Scaled Vertical Pitch in Gate-All-Around Nanosheet Devices by Independent Inner-Outer Work-function Tuning

 
dc.contributor.authorGaddemane, Gautam
dc.contributor.authorBhuwalka, Krishna
dc.contributor.authorRzepa, Gerhard
dc.contributor.authorSchuddinck, Pieter
dc.contributor.authorArimura, Hiroaki
dc.contributor.authorMatagne, Philippe
dc.contributor.authorWu, Hao
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorHellings, Geert
dc.contributor.authorLiu, Changze
dc.contributor.imecauthorGaddemane, Gautam
dc.contributor.imecauthorSchuddinck, Pieter
dc.contributor.imecauthorArimura, Hiroaki
dc.contributor.imecauthorMatagne, Philippe
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorHellings, Geert
dc.contributor.orcidimecGaddemane, Gautam::0000-0003-0067-8674
dc.contributor.orcidimecSchuddinck, Pieter::0000-0003-1893-3135
dc.contributor.orcidimecArimura, Hiroaki::0000-0002-3138-708X
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecMatagne, Philippe::0000-0003-0365-2066
dc.date.accessioned2025-06-17T12:00:20Z
dc.date.available2024-09-14T17:21:08Z
dc.date.available2025-06-17T12:00:20Z
dc.date.issued2024
dc.identifier.doi10.1109/EDTM58488.2024.10512044
dc.identifier.eisbn979-8-3503-7152-9
dc.identifier.isbn979-8-3503-8308-9
dc.identifier.issnN/A
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44485
dc.publisherIEEE
dc.source.beginpage445
dc.source.conference8th Electron Devices Technology & Manufacturing Conference (EDTM)
dc.source.conferencedateMAR 03-06, 2024
dc.source.conferencelocationBangalore
dc.source.endpage447
dc.source.journalN/A
dc.source.numberofpages3
dc.title

Multi-VT Options at Scaled Vertical Pitch in Gate-All-Around Nanosheet Devices by Independent Inner-Outer Work-function Tuning

dc.typeProceedings paper
dspace.entity.typePublication
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