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Investigation of the influence of UBM on lead free flip chip solder fatigue life by explicit finite element modeling of intermetallic layers
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Investigation of the influence of UBM on lead free flip chip solder fatigue life by explicit finite element modeling of intermetallic layers
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Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Limaye, Paresh
;
Vandevelde, Bart
;
Labie, Riet
;
Ratchev, Petar
;
Beyne, Eric
;
Vandepitte, Dirk
;
Verlinden, Bert
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1967
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
1967
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-10
Citations