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Articles
Simulation study for the CDM ESD behaviour of the grounded-gate nMOS
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Simulation study for the CDM ESD behaviour of the grounded-gate nMOS
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Date
1996
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Russ, Christian
;
Verhaege, Koen
;
Bock, Karlheinz
;
Groeseneken, Guido
;
Maes, Herman
Journal
Microelectronics and Reliability
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1974
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
1974
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-10
Citations