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A snapshot review on metal-semiconductor contact exploration for 7-nm CMOS technology and beyond
Publication:
A snapshot review on metal-semiconductor contact exploration for 7-nm CMOS technology and beyond
Date
2022-11-21
Journal Article Review
https://doi.org/10.1557/s43580-022-00404-1
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Published version
3.27 MB
Accepted version
2.32 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Yu, Hao
;
Schaekers, Marc
;
Everaert, Jean-Luc
;
Horiguchi, Naoto
;
De Meyer, Kristin
;
Collaert, Nadine
Journal
MRS ADVANCES
Abstract
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322
since deposited on 2022-12-05
Acq. date: 2025-10-23
Views
1545
since deposited on 2022-12-05
Acq. date: 2025-10-23
Citations
Metrics
Downloads
322
since deposited on 2022-12-05
Acq. date: 2025-10-23
Views
1545
since deposited on 2022-12-05
Acq. date: 2025-10-23
Citations