Publication:
Comparison between drain induced barrier lowering in partially and fully depleted 0.13 μm SOI nMOSFETs in low temperature operation
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1919 since deposited on 2021-10-15
Acq. date: 2026-01-11
Citations
Metrics
Views
1919 since deposited on 2021-10-15
Acq. date: 2026-01-11
Citations