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Statistical assessment of the full VG/VD degradation space using dedicated device arrays
Publication:
Statistical assessment of the full VG/VD degradation space using dedicated device arrays
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Date
2017
Proceedings Paper
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35071.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bury, Erik
;
Kaczer, Ben
;
Chuang, Kent
;
Franco, Jacopo
;
Weckx, Pieter
;
Vaisman Chasin, Adrian
;
Simicic, Marko
;
Linten, Dimitri
;
Groeseneken, Guido
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1967
since deposited on 2021-10-24
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Acq. date: 2025-12-16
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Metrics
Views
1967
since deposited on 2021-10-24
3
last month
Acq. date: 2025-12-16
Citations