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Statistical assessment of the full VG/VD degradation space using dedicated device arrays

Date

2017
Proceedings Paper
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dc.contributor.authorBury, Erik
dc.contributor.authorKaczer, Ben
dc.contributor.authorChuang, Kent
dc.contributor.authorFranco, Jacopo
dc.contributor.authorWeckx, Pieter
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorSimicic, Marko
dc.contributor.authorLinten, Dimitri
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorChuang, Kent
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2021-10-24T03:13:18Z
dc.date.available2021-10-24T03:13:18Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27950
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7936265/
dc.source.beginpage2D-5.1
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate2/04/2017
dc.source.conferencelocationMonterey, CA USA
dc.source.endpage2D-5.6
dc.title

Statistical assessment of the full VG/VD degradation space using dedicated device arrays

dc.typeProceedings paper
dspace.entity.typePublication
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