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Towards accurate composition analysis of GaN and AlGaN using Atom Probe Tomography
Publication:
Towards accurate composition analysis of GaN and AlGaN using Atom Probe Tomography
Date
2018
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Morris, Richard
;
Cuduvally, Ramya
;
Melkonyan, Davit
;
Fleischmann, Claudia
;
Zhao, Ming
;
Arnoldi, Laurent
;
van der Heide, Paul
;
Vandervorst, Wilfried
Journal
Journal of Vacuum Science and Technology B
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Views
1920
since deposited on 2021-10-25
Acq. date: 2025-10-27
Citations
Metrics
Views
1920
since deposited on 2021-10-25
Acq. date: 2025-10-27
Citations