Publication:
Characterization of trap density in Indium-Gallium-Zinc-Oxide thin films by admittance measurements in multi-finger MOS structures
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752 since deposited on 2024-03-27
3last month
Acq. date: 2026-04-05
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Statistics
Views
752 since deposited on 2024-03-27
3last month
Acq. date: 2026-04-05
Citations