Publication:
Characterization of trap density in Indium-Gallium-Zinc-Oxide thin films by admittance measurements in multi-finger MOS structures
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748 since deposited on 2024-03-27
3last month
Acq. date: 2025-12-15
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Views
748 since deposited on 2024-03-27
3last month
Acq. date: 2025-12-15
Citations