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Experimental one- and two-dimensional mechanical stress characterization of silicon microsystems using micro-Raman spectroscopy
Publication:
Experimental one- and two-dimensional mechanical stress characterization of silicon microsystems using micro-Raman spectroscopy
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Date
2000
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
van Spengen, Merlijn
;
De Wolf, Ingrid
;
Knechtel, R.
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Abstract
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1958
since deposited on 2021-10-14
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Acq. date: 2025-12-09
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Views
1958
since deposited on 2021-10-14
2
last month
1
last week
Acq. date: 2025-12-09
Citations