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Replacement metal contact using sacrificial ILD0 for wrap around contact in scaled FinFET technology
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Replacement metal contact using sacrificial ILD0 for wrap around contact in scaled FinFET technology
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Date
2018
Proceedings Paper
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37995.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chew, Soon Aik
;
Demuynck, Steven
;
Zhang, Liping
;
Pacco, Antoine
;
Devriendt, Katia
;
Teugels, Lieve
;
Hopf, Toby
;
Versluijs, Janko
;
Vrancken, Christa
;
Dangol, Anish
;
Altamirano Sanchez, Efrain
;
Mocuta, Dan
;
Horiguchi, Naoto
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1971
since deposited on 2021-10-25
Acq. date: 2025-12-16
Citations
Metrics
Views
1971
since deposited on 2021-10-25
Acq. date: 2025-12-16
Citations