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Analysis of warpage of a flip-chip BGA package under thermal loading: Finite element modelling and experimental validation
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Analysis of warpage of a flip-chip BGA package under thermal loading: Finite element modelling and experimental validation
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Date
2023
Journal article
https://doi.org/10.1016/j.mee.2023.111947
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Salahouelhadj, Abdellah
;
Gonzalez, Mario
;
Vanstreels, Kris
;
Van der Plas, Geert
;
Beyer, Gerald
;
Beyne, Eric
Journal
MICROELECTRONIC ENGINEERING
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1279
since deposited on 2023-03-24
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Acq. date: 2025-12-15
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Metrics
Views
1279
since deposited on 2023-03-24
3
last month
2
last week
Acq. date: 2025-12-15
Citations