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Comparison of temperature dependent carrier transport in FinFET and gate-all-Around nanowire FET
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Comparison of temperature dependent carrier transport in FinFET and gate-all-Around nanowire FET
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Date
2020
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kim, Soohyun
;
Kim, Jungchun
;
Jang, Doyoung
;
Ritzenthaler, Romain
;
Parvais, Bertrand
;
Mitard, Jerome
;
Mertens, Hans
;
Chiarella, Thomas
;
Horiguchi, Naoto
;
Lee, Jae Woo
Journal
Applied Sciences
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1935
since deposited on 2021-10-28
Acq. date: 2025-12-12
Citations
Metrics
Views
1935
since deposited on 2021-10-28
Acq. date: 2025-12-12
Citations