Publication:

Comparison of temperature dependent carrier transport in FinFET and gate-all-Around nanowire FET

Date

2020
Journal article
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dc.contributor.authorKim, Soohyun
dc.contributor.authorKim, Jungchun
dc.contributor.authorJang, Doyoung
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorParvais, Bertrand
dc.contributor.authorMitard, Jerome
dc.contributor.authorMertens, Hans
dc.contributor.authorChiarella, Thomas
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorLee, Jae Woo
dc.contributor.imecauthorJang, Doyoung
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorMertens, Hans
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.date.accessioned2021-10-28T23:20:27Z
dc.date.available2021-10-28T23:20:27Z
dc.date.issued2020
dc.identifier.issn2076-3417
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35390
dc.identifier.urlhttps://doi.org/10.3390/app10082979
dc.source.beginpage2979
dc.source.issue8
dc.source.journalApplied Sciences
dc.source.volume10
dc.title

Comparison of temperature dependent carrier transport in FinFET and gate-all-Around nanowire FET

dc.typeJournal article
dspace.entity.typePublication
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