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Conference contributions
Barrier/liner stacks for scaling the Cu interconnect metallization
Publication:
Barrier/liner stacks for scaling the Cu interconnect metallization
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Date
2016
Proceedings Paper
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33683.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
van der Veen, Marleen
;
Jourdan, Nicolas
;
Vega Gonzalez, Victor
;
Wilson, Chris
;
Heylen, Nancy
;
Varela Pedreira, Olalla
;
Struyf, Herbert
;
Croes, Kristof
;
Boemmels, Juergen
;
Tokei, Zsolt
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1977
since deposited on 2021-10-23
Acq. date: 2025-12-16
Citations
Metrics
Views
1977
since deposited on 2021-10-23
Acq. date: 2025-12-16
Citations