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Quantifying self-heating effects with scaling in globally strained Si MOSFETS
Publication:
Quantifying self-heating effects with scaling in globally strained Si MOSFETS
Date
2007
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Agaiby, R.
;
Yang, Y.
;
Olsen, S.H.
;
O'Neill, A.G.
;
Eneman, Geert
;
Verheyen, Peter
;
Loo, Roger
;
Claeys, Cor
Journal
Solid-State Electronics
Abstract
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1974
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1974
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations