Publication:
Quantifying self-heating effects with scaling in globally strained Si MOSFETS
Date
| dc.contributor.author | Agaiby, R. | |
| dc.contributor.author | Yang, Y. | |
| dc.contributor.author | Olsen, S.H. | |
| dc.contributor.author | O'Neill, A.G. | |
| dc.contributor.author | Eneman, Geert | |
| dc.contributor.author | Verheyen, Peter | |
| dc.contributor.author | Loo, Roger | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Eneman, Geert | |
| dc.contributor.imecauthor | Verheyen, Peter | |
| dc.contributor.imecauthor | Loo, Roger | |
| dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
| dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
| dc.date.accessioned | 2021-10-16T15:00:13Z | |
| dc.date.available | 2021-10-16T15:00:13Z | |
| dc.date.issued | 2007 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11629 | |
| dc.source.beginpage | 1473 | |
| dc.source.endpage | 1478 | |
| dc.source.issue | 11_12 | |
| dc.source.journal | Solid-State Electronics | |
| dc.source.volume | 51 | |
| dc.title | Quantifying self-heating effects with scaling in globally strained Si MOSFETS | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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