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Analysis of homogeneous broadening in n-type doped Ge layers on Si for laser application
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Analysis of homogeneous broadening in n-type doped Ge layers on Si for laser application
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Date
2017
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Srinivasan, Ashwyn
;
Porret, Clément
;
Pantouvaki, Marianna
;
Shimura, Yosuke
;
Gieregat, Pieter
;
Loo, Roger
;
Van Campenhout, Joris
;
Van Thourhout, Dries
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1901
since deposited on 2021-10-24
2
last month
Acq. date: 2025-12-15
Citations