Publication:
Improved hot-carrier reliability in a 0.5-µm TLM CMOS process by back-end process optimization
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2055 since deposited on 2021-09-29
3last month
Acq. date: 2025-12-10
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Views
2055 since deposited on 2021-09-29
3last month
Acq. date: 2025-12-10
Citations