Publication:

Improved hot-carrier reliability in a 0.5-µm TLM CMOS process by back-end process optimization

Date

1994

Proceedings Paper

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Files

378.pdf 419.3 KB

Author(s)

Van den Bosch, Geert

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Statistics

2059 since deposited on 2021-09-29

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Acq. date: 2026-04-26