Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Improved hot-carrier reliability in a 0.5-µm TLM CMOS process by back-end process optimization
Publication:
Improved hot-carrier reliability in a 0.5-µm TLM CMOS process by back-end process optimization
Date
1994
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
378.pdf
419.3 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van den Bosch, Geert
;
Deferm, Ludo
;
Forester, Lynn
;
Collins, Tom
Journal
Abstract
Description
Metrics
Views
2051
since deposited on 2021-09-29
Acq. date: 2025-10-24
Citations
Metrics
Views
2051
since deposited on 2021-09-29
Acq. date: 2025-10-24
Citations