Publication:

Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates

Date

2014

Journal article

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Files

27046.pdf 1.02 MB

Author(s)

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Raghavan, Praveen

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Catthoor, Francky

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Van der Perre, Liesbet

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Lauwereins, Rudy

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Groeseneken, Guido

Journal

IEEE Transactions on Device and Materials Reliability

Metrics

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Acq. date: 2026-01-06