Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates

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Author(s)

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Raghavan, Praveen

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Catthoor, Francky

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Van der Perre, Liesbet

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Lauwereins, Rudy

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Groeseneken, Guido

Journal

IEEE Transactions on Device and Materials Reliability

Metrics

1857 since deposited on 2021-10-22

Acq. date: 2025-10-29