Publication:

Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates

Date

2014
Journal article
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dc.contributor.authorKukner, Halil
dc.contributor.authorKhan, Seyab
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorHamdioui, Said
dc.contributor.authorKaczer, Ben
dc.contributor.authorCatthoor, Francky
dc.contributor.authorVan der Perre, Liesbet
dc.contributor.authorLauwereins, Rudy
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.date.accessioned2021-10-22T02:42:09Z
dc.date.available2021-10-22T02:42:09Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24073
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6529142&queryText%3DComparison+of+reaction-diffusion+and+atomisti
dc.source.beginpage182
dc.source.endpage193
dc.source.issue1
dc.source.journalIEEE Transactions on Device and Materials Reliability
dc.source.volume14
dc.title

Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates

dc.typeJournal article
dspace.entity.typePublication
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