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Interconnect test for 3D stacked memory-on-logic
Publication:
Interconnect test for 3D stacked memory-on-logic
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Date
2014-03
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Taouil, Mottaqiallah
;
Masadeh, Mahmoud
;
Hamdioui, Said
;
Marinissen, Erik Jan
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Views
1851
since deposited on 2021-10-22
1
last month
Acq. date: 2025-12-15
Citations