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Ion-bombardment effects on PtSi/n-Si Schottky contacts studied by ballistic electron emission microscopy
Publication:
Ion-bombardment effects on PtSi/n-Si Schottky contacts studied by ballistic electron emission microscopy
Date
2000
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ruttens, Gerlinde
;
Qu, X. P.
;
Zhu, S. Y.
;
Li, Bing-Zong
;
Detavernier, C.
;
Van Meirhaeghe, R. L.
;
Cardon, F.
;
Donaton, R. A.
;
Maex, Karen
Journal
J. Vacuum Science and Technology B
Abstract
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2012
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
2012
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations