Publication:
Ion-bombardment effects on PtSi/n-Si Schottky contacts studied by ballistic electron emission microscopy
Date
| dc.contributor.author | Ruttens, Gerlinde | |
| dc.contributor.author | Qu, X. P. | |
| dc.contributor.author | Zhu, S. Y. | |
| dc.contributor.author | Li, Bing-Zong | |
| dc.contributor.author | Detavernier, C. | |
| dc.contributor.author | Van Meirhaeghe, R. L. | |
| dc.contributor.author | Cardon, F. | |
| dc.contributor.author | Donaton, R. A. | |
| dc.contributor.author | Maex, Karen | |
| dc.contributor.imecauthor | Maex, Karen | |
| dc.date.accessioned | 2021-10-14T13:41:41Z | |
| dc.date.available | 2021-10-14T13:41:41Z | |
| dc.date.issued | 2000 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4711 | |
| dc.source.beginpage | 1942 | |
| dc.source.endpage | 1948 | |
| dc.source.issue | 4 | |
| dc.source.journal | J. Vacuum Science and Technology B | |
| dc.source.volume | 18 | |
| dc.title | Ion-bombardment effects on PtSi/n-Si Schottky contacts studied by ballistic electron emission microscopy | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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