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Study of DC stress induced leakage current (SILC) and its dependence on oxide nitridation
Publication:
Study of DC stress induced leakage current (SILC) and its dependence on oxide nitridation
Date
1996
Proceedings Paper
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1126.pdf
371.19 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Blauwe, Jan
;
Degraeve, Robin
;
Bellens, Rudi
;
Van Houdt, Jan
;
Roussel, Philippe
;
Groeseneken, Guido
;
Maes, Herman
Journal
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2016
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
2016
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations