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Comparison between Si/SiO2 mid-gap interface states and deep levels associated with silicon-oxygen superlattices in p-type silicon
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Comparison between Si/SiO2 mid-gap interface states and deep levels associated with silicon-oxygen superlattices in p-type silicon
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Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Jayachandran, Suseendran
;
Delabie, Annelies
;
Caymax, Matty
;
Heyns, Marc
Journal
Physica Status Solidi C
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1882
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Acq. date: 2025-12-15
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Views
1882
since deposited on 2021-10-23
3
last month
Acq. date: 2025-12-15
Citations