Aging-Aware Timing Models for Reliability Enhancement of Inverter-Transmission Gate-Based Circuits

Abstract

Editor’s notes: The article introduces a variation-aware timing model, emphasizing aging, for the INV-Tx structure. By reducing aging-induced degradation in a thermometer encoder, this method can eliminate the need for errordetection circuits in data converters, ensuring accurate digital encoding. —Hemangee K. Kapoor, IIT Guwahati, India