Publication:
Impact of the TiN layer thickness on the low-frequency noise and static device performance of n-channel MuGFETs
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1799 since deposited on 2021-10-18
Acq. date: 2025-12-12
Citations
Metrics
Views
1799 since deposited on 2021-10-18
Acq. date: 2025-12-12
Citations