Publication:

Impact of the TiN layer thickness on the low-frequency noise and static device performance of n-channel MuGFETs

Date

2009
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorRodrigues, Michele
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorCollaert, Nadine
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorMartino, J.A.
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-18T02:18:27Z
dc.date.available2021-10-18T02:18:27Z
dc.date.embargo9999-12-31
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16111
dc.source.beginpage167
dc.source.conference20th International Conference on Noise and Fluctuations - ICNF
dc.source.conferencedate14/06/2009
dc.source.conferencelocationPisa Italy
dc.source.endpage170
dc.title

Impact of the TiN layer thickness on the low-frequency noise and static device performance of n-channel MuGFETs

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
18109.pdf
Size:
368.17 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions