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Articles
Dielectric Response Spectroscopy as Means to Investigate Interfacial Effects for Ultra-Thin Film Polymer-Based High NA EUV Lithography
Publication:
Dielectric Response Spectroscopy as Means to Investigate Interfacial Effects for Ultra-Thin Film Polymer-Based High NA EUV Lithography
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Date
2020
Journal article
https://doi.org/10.3390/polym12122971
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5.48 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Severi, Joren
;
De Simone, Danilo
;
De Gendt, Stefan
Journal
POLYMERS
Abstract
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224
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1823
since deposited on 2021-11-02
Acq. date: 2026-01-10
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Metrics
Downloads
224
since deposited on 2021-11-02
24
last month
4
last week
Acq. date: 2026-01-10
Views
1823
since deposited on 2021-11-02
Acq. date: 2026-01-10
Citations