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On the trap generation rate in ultrathin SiON under constant voltage stress
Publication:
On the trap generation rate in ultrathin SiON under constant voltage stress
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Date
2005-06
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Kaczer, Ben
;
Roussel, Philippe
;
Groeseneken, Guido
Journal
Microelectronic Engineering
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1814
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Acq. date: 2025-12-15
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Metrics
Views
1814
since deposited on 2021-10-16
2
last month
Acq. date: 2025-12-15
Citations