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Layout-induced stress effects in 14nm & 10nm FinFETs and their impact on performance
Publication:
Layout-induced stress effects in 14nm & 10nm FinFETs and their impact on performance
Date
2013
Proceedings Paper
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26151.pdf
1.43 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Garcia Bardon, Marie
;
Moroz, Victor
;
Eneman, Geert
;
Schuddinck, Pieter
;
Dehan, Morin
;
Yakimets, Dmitry
;
Jang, Doyoung
;
Van der Plas, Geert
;
Mercha, Abdelkarim
;
Thean, Aaron
;
Verkest, Diederik
;
Steegen, An
Journal
Abstract
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Metrics
Views
2023
since deposited on 2021-10-21
435
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations