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Exploration of BEOL line-space patterning options at 12nm half-pitch and below
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Exploration of BEOL line-space patterning options at 12nm half-pitch and below
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Date
2018
Proceedings Paper
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36928.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Decoster, Stefan
;
Lazzarino, Frederic
;
Petersen Barbosa Lima, Lucas
;
Li, Waikin
;
Versluijs, Janko
;
Halder, Sandip
;
Mallik, Arindam
;
Murdoch, Gayle
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2084
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Acq. date: 2025-12-15
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Metrics
Views
2084
since deposited on 2021-10-25
7
last month
Acq. date: 2025-12-15
Citations