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Fundamental study of the apparent voltage-dependence of NBTI kinetics by constant electric field stress in Si and SiGe devices
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Fundamental study of the apparent voltage-dependence of NBTI kinetics by constant electric field stress in Si and SiGe devices
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Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mukhopadhyay, Subhadeep
;
Franco, Jacopo
;
Vaisman Chasin, Adrian
;
Roussel, Philippe
;
Kaczer, Ben
;
Groeseneken, Guido
;
Horiguchi, Naoto
;
Linten, Dimitri
;
Thean, Aaron
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1868
since deposited on 2021-10-23
Acq. date: 2025-12-16
Citations
Metrics
Views
1868
since deposited on 2021-10-23
Acq. date: 2025-12-16
Citations