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Stress hybridization for multigate devices fabricated on supercritical strained-SOI (SC-SSOI)
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Stress hybridization for multigate devices fabricated on supercritical strained-SOI (SC-SSOI)
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Collaert, Nadine
;
Rooyackers, Rita
;
De Keersgieter, An
;
Leys, Frederik
;
Cayrefourcq, I.
;
Ghyselen, Bruno
;
Loo, Roger
;
Jurczak, Gosia
;
Biesemans, Serge
Journal
IEEE Electron Device Letters
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1916
since deposited on 2021-10-16
Acq. date: 2025-12-16
Citations
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Views
1916
since deposited on 2021-10-16
Acq. date: 2025-12-16
Citations