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Sputtering yield: Si and SiGe under O2-bombardment
Publication:
Sputtering yield: Si and SiGe under O2-bombardment
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Date
2000
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Janssens, Tom
;
Vandervorst, Wilfried
Journal
Abstract
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1869
since deposited on 2021-10-14
Acq. date: 2025-12-15
Citations
Metrics
Views
1869
since deposited on 2021-10-14
Acq. date: 2025-12-15
Citations