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Observation and understanding of anisotropic strain relaxation in selectively grown SiGe fin structures

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dc.contributor.authorSchulze, Andreas
dc.contributor.authorLoo, Roger
dc.contributor.authorRyan, Paul
dc.contributor.authorWormington, Matthew
dc.contributor.authorFavia, Paola
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorCollaert, Nadine
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorCaymax, Matty
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorFavia, Paola
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecFavia, Paola::0000-0002-1019-3497
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-24T13:10:13Z
dc.date.available2021-10-24T13:10:13Z
dc.date.issued2017
dc.identifier.issn0957-4484
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29400
dc.identifier.urlhttp://iopscience.iop.org/article/10.1088/1361-6528/aa5fbb/pdf
dc.source.beginpage145703
dc.source.issue14
dc.source.journalNanotechnology
dc.source.volume28
dc.title

Observation and understanding of anisotropic strain relaxation in selectively grown SiGe fin structures

dc.typeJournal article
dspace.entity.typePublication
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