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Conference contributions
A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays
Publication:
A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays
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Date
2024
Proceedings Paper
https://doi.org/10.1109/IMW59701.2024.10536950
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kim, Woojin
;
Pica, Valerio
;
Jossart, Nico
;
Yasin, Farrukh
;
Wostyn, Kurt
;
Couet, Sebastien
;
Rao, Siddharth
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N/A
Abstract
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590
since deposited on 2024-07-12
Acq. date: 2025-12-15
Citations
Metrics
Views
590
since deposited on 2024-07-12
Acq. date: 2025-12-15
Citations