Publication:

A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays

Date

2024

Proceedings Paper

https://doi.org/10.1109/IMW59701.2024.10536950

Simple item page Full metadata Statistics

Author(s)

;

;

;

;

;

Couet, Sebastien

;

Journal

N/A

Statistics

592 since deposited on 2024-07-12

Acq. date: 2026-02-26