Publication:
Electrical characterization of high-dielectric-constant/SiO2 metal-oxide-semiconductor gate stacks by a conductive atomic force microscope
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1887 since deposited on 2021-10-16
1last month
Acq. date: 2026-05-17
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Statistics
Views
1887 since deposited on 2021-10-16
1last month
Acq. date: 2026-05-17
Citations