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Articles
High aspect ratio via etch development for Cu nails in 3-D-stacked ICs
Publication:
High aspect ratio via etch development for Cu nails in 3-D-stacked ICs
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Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Aelst, Joke
;
Struyf, Herbert
;
Boullart, Werner
;
Vanhaelemeersch, Serge
Journal
Thin Solid Films
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1960
since deposited on 2021-10-17
Acq. date: 2025-12-15
Citations
Metrics
Views
1960
since deposited on 2021-10-17
Acq. date: 2025-12-15
Citations