Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Impact of substrate resistivity on the vertical leakage, breakdown, and trapping in GaN-on-Si E-Mode HEMTs
Publication:
Impact of substrate resistivity on the vertical leakage, breakdown, and trapping in GaN-on-Si E-Mode HEMTs
Date
2018
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Borga, Matteo
;
Meneghini, Matteo
;
Stoffels, Steve
;
Li, Xiangdong
;
Posthuma, Niels
;
Van Hove, Marleen
;
Decoutere, Stefaan
;
Meneghesso, Gaudenzio
;
Zanoni, Enrico
Journal
IEEE Transactions on Electron Devices
Abstract
Description
Metrics
Views
1986
since deposited on 2021-10-25
Acq. date: 2025-10-27
Citations
Metrics
Views
1986
since deposited on 2021-10-25
Acq. date: 2025-10-27
Citations