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Cu plating of through-Si vias for 3D-stacked integrated circuits

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dc.contributor.authorRadisic, Alex
dc.contributor.authorLuhn, Ole
dc.contributor.authorSwinnen, Bart
dc.contributor.authorBender, Hugo
dc.contributor.authorDrijbooms, Chris
dc.contributor.authorDoumen, Geert
dc.contributor.authorKellens, Kristof
dc.contributor.authorRuythooren, Wouter
dc.contributor.authorVereecken, Philippe
dc.contributor.imecauthorRadisic, Alex
dc.contributor.imecauthorSwinnen, Bart
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorDrijbooms, Chris
dc.contributor.imecauthorDoumen, Geert
dc.contributor.imecauthorKellens, Kristof
dc.contributor.imecauthorRuythooren, Wouter
dc.contributor.imecauthorVereecken, Philippe
dc.contributor.orcidimecVereecken, Philippe::0000-0003-4115-0075
dc.date.accessioned2021-10-17T10:02:43Z
dc.date.available2021-10-17T10:02:43Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14350
dc.source.conferenceMRS Fall Meeting Symposium E: Materials and Technologies for 3-D Integration
dc.source.conferencedate1/12/2008
dc.source.conferencelocationBoston, MA USA
dc.title

Cu plating of through-Si vias for 3D-stacked integrated circuits

dc.typeOral presentation
dspace.entity.typePublication
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