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Investigation of stress in shallow trench isolation using UV micro-raman spectroscopy
Publication:
Investigation of stress in shallow trench isolation using UV micro-raman spectroscopy
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Date
2001
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Dombrowski, Kai
;
Dietrich, B.
;
De Wolf, Ingrid
;
Rooyackers, Rita
;
Badenes, Gonçal
Journal
Microelectronics Reliability
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1936
since deposited on 2021-10-14
Acq. date: 2026-01-07
Citations
Metrics
Views
1936
since deposited on 2021-10-14
Acq. date: 2026-01-07
Citations