Publication:

Localization of off-stress-induced damage in AlGaNGaN HEMTs by means of low frequency 1/f noise measurements

Date

2013
Journal article
https://doi.org/10.1063/1.4816424
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dc.contributor.authorSilvestri, Marco
dc.contributor.authorUren, Michael
dc.contributor.authorKillat, Nicolle
dc.contributor.authorMarcon, Denis
dc.contributor.authorKuball, Martin
dc.contributor.imecauthorMarcon, Denis
dc.date.accessioned2021-10-21T12:03:50Z
dc.date.available2021-10-21T12:03:50Z
dc.date.embargo9999-12-31
dc.date.issued2013
dc.identifier.doi10.1063/1.4816424
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23083
dc.source.beginpage43506
dc.source.issue4
dc.source.journalApplied Physics Letters
dc.source.volume103
dc.title

Localization of off-stress-induced damage in AlGaNGaN HEMTs by means of low frequency 1/f noise measurements

dc.typeJournal article
dspace.entity.typePublication
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