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Articles
Optimizing Insulated-Gate Bipolar Transistors' Lifetime Estimation: A Critical Evaluation of Lifetime Model Adjustments Based on Power Cycling Tests
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Optimizing Insulated-Gate Bipolar Transistors' Lifetime Estimation: A Critical Evaluation of Lifetime Model Adjustments Based on Power Cycling Tests
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Date
2024
Journal article
https://doi.org/10.3390/en17112616
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Alavi, Omid
;
De Ceuninck, Ward
;
Daenen, Michaël
Journal
ENERGIES
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Downloads
136
since deposited on 2024-06-20
9
last month
2
last week
Acq. date: 2026-03-16
Views
681
since deposited on 2024-06-20
1
last month
Acq. date: 2026-03-16
Citations