Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Optimizing Insulated-Gate Bipolar Transistors' Lifetime Estimation: A Critical Evaluation of Lifetime Model Adjustments Based on Power Cycling Tests
Publication:
Optimizing Insulated-Gate Bipolar Transistors' Lifetime Estimation: A Critical Evaluation of Lifetime Model Adjustments Based on Power Cycling Tests
Copy permalink
Date
2024
Journal article
https://doi.org/10.3390/en17112616
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
Published version
5.9 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Alavi, Omid
;
De Ceuninck, Ward
;
Daenen, Michaël
Journal
ENERGIES
Abstract
Description
Metrics
Downloads
116
since deposited on 2024-06-20
8
last month
3
last week
Acq. date: 2026-01-11
Views
675
since deposited on 2024-06-20
4
last month
1
last week
Acq. date: 2026-01-12
Citations
Metrics
Downloads
116
since deposited on 2024-06-20
8
last month
3
last week
Acq. date: 2026-01-11
Views
675
since deposited on 2024-06-20
4
last month
1
last week
Acq. date: 2026-01-12
Citations